KSV Quartz Crystal Microbalance
The KSV Quartz Crystal Microbalance (QCM) is unique as it stands alone as the sole representative of the second generation of this range of instrument as it uses the Impedance Analysis technique. The use of the Impedance Spectroscopy technique provides data, not just on the Frequency and Dissipation, which was available on first generation instruments, but also on the Impedance, Reactance and Resistance, plus more, thus giving the instrument an entirely new window on any fast or slow change to the system on test. Applications cover research biomaterials, biofouling, drug development, liposome systems, electrochemistry, functionalised surfaces and thin film properties in biomaterials as well as solid and semi-solid materials. Film thickness can be measured from a few nanometres to several hundred nanometres and the visco-elastic properties can be well defined using the KSC-Z500 QCM. HOT NEWS – the KSV-Z500 Quartz Crystal Microbalance (QCM) has made this technology even more affordable than ever before – contact us at info@scisol.com.au for more information.
Surface Tension (dynamic) from SITA GmbH
Dynamic Surface Tension measurements can be made using
SITA
F10 and t60 Surface Tensionmeters, which utilise the bubble pressure
method, which provides the ability to measure surface tension during
shear, thus duplicating the performance of liquids in real processes.
This is important for Surfactants, Inks, Plating Baths and a variety
of other applications.
Surface Tension (static) from KSV
Static Surface Tension can be measured using the traditional Wilhelmy Plate and De Nouy ring methods with the Sigma Series instruments from KSV. These are available in different versions catering for teaching or routine applications, or to meet the most rigorous R & D needs. The Sigma 701 has a resolution of 0.01µN with a measuring range of 0.01 to 2000mN/m.
Langmuir and Langmuir Blodgett Apparatus from KSV
High quality Langmuir Film Balance and Langmuir Blodgett troughs are available from KSV for monolayer and multilayer analysis and fabrication.
Contact Angle measurement from KSV
The CAM100, CAM101 and CAM200 video camera based contact angle measurement devices. The CAM100 is a basic PC controlled contact angle measurement devices, whereas the CAM200 additionally is able to measure static and dynamic contact angle, surface free energies, absorption and surface tension by the pendant drop method. True real-time Firewire cameras are available on all levels of instrument, even the CAM100 is fitted with a 30fps camera!!!!
Electrochemistry equipment from GAMRY ( Australia only)
Gamry Instruments manufacture high quality electrochemical measurement instruments using Impedance Spectroscopy to aid in research and development if Batteries, Fuel Cells, Paints and Coatings, Corrosion and Physical Electrochemistry. The new Reference 600 Potentiostat/Galvanostat/ZRA system perfectly complement the PC14 and FAS2 systems. With output currents up to ±600mA, a resolution of 0.018fA, and a frequency range from 10µHz to 1MHz, these instruments are among the most capable available. Gamry software works with all potentiostats, so the systems are very flexible – unique open source scripting techniques ensure that you will never be limited by the concepts of the Software Engineer!
Kelvin Probes from KP Technologies
Kelvin Probes are an old technique given a new lease of life through the efforts of KP Technologies. Using new technoloies, they have upgraded this technique to be able to provide a new window on surface structures throught the quantifcation of work function and surface charge. This enables the measurement and mapping of surface species down to the micron level, opening up new windows for understanding surface structures. Surface homogeneity or, alternatively surface features can be viewed from the charge or work function point of view.
Ellipsometers from J A Woollam
J A Woollam manufacture a range of Spectroscopic Ellipsometers for Research and Development laboratories, Quality Control and even Process applications. Using several tools, Ellipsometers can quantify the thickness of thin films, optical constants, surface layers, interfaciqal mixing, composition, crystallinity, ansitropy and uniformity and several other factors depending sample and instrument configuration.
Measurements can be made on solid and liquid surfaces and the instruments come in several forms, having spectroscopic ranges from the UV to IR regions. They can also be laboratory based, at line or on line, fixed to deposition chambers or mounted on scanning web gantries for examining the surfaces or films in large format web coating systems.
